Journal: Nature Communications

Article Title: Enhanced superconductivity and mixed-dimensional behaviour in infinite-layer samarium nickelate thin films

doi: 10.1038/s41467-026-69650-3

Figure Lengend Snippet: a – d The X-ray diffraction (XRD) θ –2 θ symmetric patterns of Sm 0.8 Sr 0.2 NiO 2 (SSNO), Sm 0.74 Ca 0.01 Sr 0.19 Eu 0.06 NiO 2 (SCSE 0.06 ), Sm 0.79 Ca 0.04 Sr 0.05 Eu 0.12 NiO 2 (SCSE 0.12 ) Sm 0.75 Ca 0.05 Eu 0.2 NiO 2 (SCE 0.2 ) thin films. Inset of ( a ) is a schematic diagram of the atomic structure. Resistivity curves ρ ( T ) of SSNO, SCSE 0.06 , SCSE 0.12 and SCE 0.2 samples are shown in ( e – h ). Insets of ( e – h ) show the zoom-in data around the superconducting transitions. Dashed lines are linear fits to the normal state ρ ( T ) curves above the transitions. Here, T c,onset is defined as the point where the curve deviates from the linear fitting, T c,0 is defined as the zero-resistance T c . i , j are high-angle annular dark-field (HAADF) images of an SSNO thin film and an SCSE 0.06 thin film. The c -axis lattice constants are measured to be 3.34 Å for SSNO and 3.28 Å for SCSE 0.06 . The area circulated by yellow dashed line indicates a Ruddlesden-Popper (RP) stacking fault.

Article Snippet: Energy-dispersive X-ray spectroscopy (EDX) analysis was performed using a JEOL JEM-ARM200F NEOARM transmission electron microscope, equipped with a cold field-emission gun and a spherical aberration (Cs) corrector.

Techniques:

Journal: Nature Communications

Article Title: Enhanced superconductivity and mixed-dimensional behaviour in infinite-layer samarium nickelate thin films

doi: 10.1038/s41467-026-69650-3

Figure Lengend Snippet: a , b Are normalized μ 0 H c2 / T c(0 T) against reduced temperature T / T c(0 T) of RE 0.8 Sr 0.2 NiO 2 (RE: La, Pr, Nd and Sm) for \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$H\perp c$$\end{document} H ⊥ c and H // c . The data for La-, Pr- and Nd-series are adapted from Ref. . The dashed lines indicate the Pauli limit of μ 0 H c2 = 1.86 T c(0 T) . c Shows the upper critical field μ 0 H c2,50% as a function of the polar rotation angle θ measured at 5 K. Here, the cyan line is a fit using the 2D Tinkham’s model, while the dashed line is a fit using the anisotropic 3D GL model. The red line is a fit using both 2D and 3D models with the ratio of the 3D component, β . Inset of ( c ) is a schematic of the measurement geometry. d – g Are T c,50% as a function of θ measured at 9 T for the SSNO, SCSE 0.06 , SCSE 0.12 and SCE 0.2 thin films, respectively. The red lines are fits to both 2D and 3D models with the ratio of the 3D component, β ’. h , i Are the resonant inelastic X-ray scattering (RIXS) energy loss maps as a function of incident energy for two light polarizations taken on a SCE 0.2 sample. j Is the integrated intensity for both light polarizations.

Article Snippet: Energy-dispersive X-ray spectroscopy (EDX) analysis was performed using a JEOL JEM-ARM200F NEOARM transmission electron microscope, equipped with a cold field-emission gun and a spherical aberration (Cs) corrector.

Techniques: